Inventor · Suzhou, CN

Ying Lin

2Patents
1h-index
4Co-inventors
37Inventor score

Filing activity: Apr 18, 2001 → Mar 18, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US6727494B2 Method and apparatus for detecting contaminating species on a wafer edge Emerging Cross-Sectional Technologies 3 Expired
US9542963B2 Method and apparatus to detect and mitigate contamination between a read/write head and a recording medium Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.