Yohan Faucillon
2Patents
0h-index
5Co-inventors
24Inventor score
Filing activity: Jun 22, 2017 → Dec 7, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11352691B2 | Method and device for locating the origin of a defect affecting a stack of thin layers deposited on a substrate | Physics | 0 | Active |
| US11739417B2 | Method and a device for automatically determining adjustment values for operating parameters of a deposition line | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.