Inventor · Tokyo, JP

Yoichi Funatoko

1Patents
0h-index
5Co-inventors
19Inventor score

Filing activity: Jul 2, 2024 → Jul 2, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US12379395B2 Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.