Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test
US12379395B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2024 |
| Grant date | Aug 5, 2025 |
| Priority date | — |
| Expiry date | Jul 2, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test (DUT). In some examples, the probe blades are configured to provide a Kelvin electrical connection with the DUT. In some examples, the probe blades include an alignment structure configured to engage with a blade holder when the probe blade is received within a blade-receiving region of the blade holder. The blade holders are configured to separably and operatively attach a probe blade to a probe system. In some examples, the blade holders include the probe blade. The probe systems are configured to electrically test the DUT and include the blade holder.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.