Inventor · Tokyo, JP

Yoko Oikawa

2Patents
2h-index
5Co-inventors
41Inventor score

Filing activity: May 14, 1979 → Jun 22, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US4335198A Process for recording Emerging Cross-Sectional Technologies 33 Expired
US7890908B2 Method for verifying mask pattern data, method for manufacturing mask, mask pattern verification program, and method for manufacturing semiconductor device Physics 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.