Yongying Yang
3Patents
0h-index
13Co-inventors
31Inventor score
Filing activity: Apr 4, 2014 → Aug 2, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10444160B2 | Surface defects evaluation system and method for spherical optical components | Physics | 0 | Active |
| US9062959B2 | Wavelength scanning interferometer and method for aspheric surface measurement | Physics | 0 | Active |
| US11636584B2 | Real-time traceability method of width of defect based on divide-and-conquer | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.