Yudong Hao
3Patents
2h-index
7Co-inventors
37Inventor score
Filing activity: Apr 13, 2007 → May 11, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7450225B1 | Correction of optical metrology for focus offset | Physics | 7 | Active |
| US8126694B2 | Modeling conductive patterns using an effective model | Physics | 3 | Active |
| US12386342B2 | Holistic analysis of multidimensional sensor data for substrate processing equipment | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.