Inventor · Tsukuba, JP

Yuji Hirao

4Patents
2h-index
13Co-inventors
45Inventor score

Filing activity: Jun 6, 1996 → Sep 16, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US5760597A Method of and apparatus for measuring lifetime of carriers in semiconductor sample Electricity 8 Expired
US5790252A Method of and apparatus for determining residual damage to wafer edges Electricity 6 Expired
US8564388B2 Relay, control circuit, and method for controlling control circuit Electricity 1 Active
US11773368B2 Culture method for differentiating primordial germ cells into functionally mature oocytes Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.