Yujin Cho
1Patents
0h-index
6Co-inventors
19Inventor score
Filing activity: Aug 19, 2022 → Aug 19, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12362139B2 | Semiconductor inspection apparatus and semiconductor inspection method using the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.