Yukio Saka
1Patents
1h-index
7Co-inventors
25Inventor score
Filing activity: Feb 10, 2003 → Feb 10, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7171592B2 | Self-testing circuit in semiconductor memory device | Physics | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.