Yury Yuditsky
8Patents
2h-index
18Co-inventors
44Inventor score
Filing activity: Feb 9, 2012 → Apr 7, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9426400B2 | Method and apparatus for high speed acquisition of moving images using pulsed illumination | Electricity | 29 | Active |
| US9279774B2 | Wafer inspection | Physics | 20 | Active |
| US9091666B2 | Extended defect sizing range for wafer inspection | Physics | 1 | Active |
| US10488348B2 | Wafer inspection | Physics | 1 | Active |
| US9915622B2 | Wafer inspection | Physics | 0 | Active |
| US10495579B2 | System and method for compensation of illumination beam misalignment | Physics | 0 | Active |
| US12345658B2 | Large-particle monitoring with laser power control for defect inspection | Physics | 0 | Active |
| US9587936B2 | Scanning inspection system with angular correction | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.