Yuuichi Kunitomo
3Patents
2h-index
15Co-inventors
31Inventor score
Filing activity: Jul 19, 2004 → Sep 3, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7333191B2 | Scanning probe microscope and measurement method using the same | Physics | 5 | Expired |
| US7388199B2 | Probe manufacturing method, probe, and scanning probe microscope | Physics | 3 | Expired |
| US7350404B2 | Scanning type probe microscope and probe moving control method therefor | Emerging Cross-Sectional Technologies | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.