Yuuki Ojima
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Feb 18, 2004 → Feb 18, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7053371B2 | Scanning electron microscope with measurement function | Electricity | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.