Ze'ev Raz
3Patents
1h-index
9Co-inventors
30Inventor score
Filing activity: Feb 26, 2014 → Apr 30, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9330792B2 | Testing memory devices with distributed processing operations | Physics | 3 | Active |
| US9842038B2 | Method and system for advanced fail data transfer mechanisms | Physics | 1 | Active |
| US9558852B2 | Method and apparatus for defect repair in NAND memory device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.