Zhengyi PAN
1Patents
0h-index
2Co-inventors
16Inventor score
Filing activity: Aug 23, 2022 → Aug 23, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11783474B1 | Defective picture generation method and apparatus applied to industrial quality inspection | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.