Defective picture generation method and apparatus applied to industrial quality inspection
US11783474B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2022 |
| Grant date | Oct 10, 2023 |
| Priority date | — |
| Expiry date | Aug 23, 2042 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A defective picture generation method applied to industrial quality inspection and a defective picture generation apparatus applied to industrial quality inspection are provided. The method includes: acquiring a first workpiece picture set with defects and a second workpiece picture set without defects; determining a defect annotation picture corresponding to each first workpiece picture in the first workpiece picture set; determining a feature value of each second workpiece picture in the second workpiece picture set; training a pix2pixHD network based on the first workpiece pictures, the second workpiece pictures, the defect annotation pictures and the feature values; acquiring a target defect annotation picture from the defect feature database according to the desired defect type; acquiring a target feature value from the picture feature database according to the desired picture type; and inputting the target defect annotation picture and the target feature value into the trained generator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.