Integrated circuit chip and a method for testing the same

US10006965B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Wilhelm Haller · Winnenden, DE
• Markus Kaltenbach · Holzgerlingen, DE
• Ulrich Krauch · Waldenbuch, DE
• Nicolas Maeding · Holzgerlingen, DE
• Christian Zoellin · Waiblingen, DE

Key dates

• Filing date: Sep 16, 2016
• Grant date: Jun 26, 2018
• Expiry date: Sep 16, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318558
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An integrated circuit chip includes at least two integrated circuits, at least three scan chains, and a multiplexor circuitry. Each integrated circuit includes an integrated circuit input port and an integrated circuit output port. The scan chains and the integrated circuits are coupled by default with a series chain having integrated circuits and scan chains alternating each other. The series chain starts with an initial scan chain and ends with the end scan chain. Each scan chain except the initial one includes a first scan chain input port coupled by default with the integrated circuit output port of the respective adjacent integrated circuit. Each scan chain except the end one includes a first scan chain output port coupled by default with the integrated circuit input port of the respective adjacent integrated circuit.