Semiconductor devices and methods relating to the repairing of the same
US10013305B2 · kind B2 · utility
1Cited by
3References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 3, 2017 |
| Grant date | Jul 3, 2018 |
| Priority date | — |
| Expiry date | Apr 3, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device and or method of repairing the semiconductor device may be provided. The semiconductor device may include an error information storage circuit. The error information storage circuit may be configured to latch an address to generate a latched fail address and a rupture control signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.