Method for evaluating bandgap distributions of nanowires
US10013753B2 · kind B2 · utility
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Key dates
| Filing date | Oct 9, 2014 |
| Grant date | Jul 3, 2018 |
| Priority date | — |
| Expiry date | Jan 25, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for evaluating bandgap distributions of nanowires is provided. First, a plurality of nanowires located on a surface of a substrate is provided. Second, a metal electrode on the surface and electrically connected to the plurality of nanowires is provided. Third, a SEM image is taken on the plurality of nanowires and the metal electrode. Fourth, the bandgap distributions of the plurality of nanowires are evaluated through the SEM image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.