Patent · US Active

Scale and position-measuring device having such a scale

US10018485B2 · kind B2 · utility

0Cited by

1References

10Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Stefan Funk · Leichlingen, DE
Peter Speckbacher · Kirchweidach, DE

Key dates

Filing date	Jan 26, 2017
Grant date	Jul 10, 2018
Priority date	—
Expiry date	Jan 26, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG02B5/1861
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A scale for an optically scanning position-measuring device includes a carrier and a reflective layer disposed on the carrier. A transparent spacer layer is disposed on the reflective layer. The spacer layer has a patterned, partially transparent layer thereon which defines a bright/dark pattern in which regions having the partially transparent layer appear dark and regions without the partially transparent layer appear bright. A sealing layer is disposed on the patterned, partially transparent layer. Products of refractive index and layer thickness are the same for the spacer layer and the sealing layer, or differ by an odd multiple.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.