Peter Speckbacher
24Patents
6h-index
29Co-inventors
69Inventor score
Filing activity: Apr 8, 1996 → Oct 1, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5852322A | Radiation-sensitive detector element and method for producing it | Emerging Cross-Sectional Technologies | 47 | Expired |
| US6605828B1 | Optoelectronic component with a space kept free from underfiller | Electricity | 30 | Expired |
| US6486467B1 | Optical detector for measuring relative displacement of an object on which a grated scale is formed | Physics | 29 | Expired |
| US6445456B2 | Photoelectric position measuring device | Physics | 14 | Expired |
| US5786931A | Phase grating and method of producing phase grating | Emerging Cross-Sectional Technologies | 12 | Expired |
| US7058309B1 | Optoelectronic transceiver | Electricity | 10 | Expired |
| US7549234B2 | Method for mounting a scale on a support and arrangement with a support and a scale | Physics | 6 | Active |
| US10094961B2 | Optical layer system | Physics | 5 | Active |
| US6621104B1 | Integrated optoelectronic thin-film sensor and method of producing same | Electricity | 3 | Expired |
| US8234793B2 | Arrangement with a scale fastened on a support | Physics | 3 | Active |
| US7707739B2 | Method for attaching a scale to a carrier, a scale, and carrier having a scale | Physics | 3 | Active |
| US7719075B2 | Scanning head for optical position-measuring systems | Emerging Cross-Sectional Technologies | 2 | Active |
| US7312878B2 | Method for manufacturing a scale, a scale manufactured according to the method and a position measuring device | Physics | 2 | Expired |
| US9677874B2 | Position-measuring device | Physics | 2 | Active |
| US6961174B1 | Reflectometer and method for manufacturing a reflectometer | Physics | 2 | Expired |
| US8650769B2 | Assembly comprising a measuring scale attached to a substrate and method for holding a measuring scale against a substrate | Emerging Cross-Sectional Technologies | 1 | Active |
| US6800404B2 | Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the method | Electricity | 0 | Expired |
| US6844558B1 | Material measure and position measuring device comprising such a material measure | Physics | 0 | Expired |
| US10018485B2 | Scale and position-measuring device having such a scale | Physics | 0 | Active |
| US10222192B2 | Method for machining a scale | Physics | 0 | Active |
| US10119802B2 | Optical position-measuring device having grating fields with different step heights | Physics | 0 | Active |
| US10914615B2 | Scanning reticle including a grating formed in a substrate for an optical position measuring device | Physics | 0 | Active |
| US11480717B2 | Grating structure for a diffractive optic | Physics | 0 | Active |
| US9453744B2 | Measuring graduation and photoelectric position measuring device having the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.