Testing an integrated circuit in user mode using partial reconfiguration
US10018675B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2014 |
| Grant date | Jul 10, 2018 |
| Priority date | — |
| Expiry date | Apr 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/327
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A programmable integrated circuit may implement a safety function in a first region and a non-safety function in a second region of the programmable integrated circuit. The safety function may require that periodic tests verify the integrity of the programmable integrated circuit during safety test intervals. For this purpose, the programmable integrated circuit may halt the operation of the safety function, partially reconfigure the first region by loading a test function, and execute the test function, while the non-safety function in the second region continues to operate. In the event that the test function executed successfully without finding any defects, the programmable integrated circuit may partially reconfigure the first region by re-loading the safety function. Additional tests may be performed if the test function detected problems with the integrity of the programmable integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.