Reliability of physical unclonable function circuits
US10038446B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2014 |
| Grant date | Jul 31, 2018 |
| Priority date | — |
| Expiry date | Aug 21, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/12
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Techniques and circuits are disclosed for obtaining a physical unclonable function (PUF) circuit that is configured to provide, during a first operational mode, an output signal that is dependent on an electric characteristic of the PUF circuit. Techniques and circuits described herein can cause the PUF circuit to enter a second operational mode by applying a stress signal to the PUF circuit that changes a value of the electric characteristic relative to another value of the electric characteristic during the first operational mode of the PUF circuit; and adjusting, based on changing the absolute value of the first electric characteristic, a bias magnitude of the output signal relative to another bias magnitude of the output signal during the first operational mode of the PUF circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.