Mudit Bhargava
60Patents
7h-index
40Co-inventors
68Inventor score
Filing activity: Dec 28, 2006 → Jul 22, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10002665B1 | Memory devices formed from correlated electron materials | Physics | 26 | Active |
| US10002669B1 | Method, system and device for correlated electron switch (CES) device operation | Physics | 18 | Active |
| US10641953B1 | Optical waveguide connecting device | Physics | 10 | Active |
| US10971229B2 | Method, system and device for integration of volatile and non-volatile memory bitcells | Electricity | 9 | Active |
| US10854291B2 | Backup and/or restore of a memory circuit | Physics | 8 | Active |
| US7545180B2 | Sense amplifier providing low capacitance with reduced resolution time | Physics | 7 | Active |
| US10218517B2 | Methods for generating reliable responses in physical unclonable functions (PUFs) and methods for designing strong PUFs | Physics | 7 | Active |
| US9891976B2 | Error detection circuitry for use with memory | Physics | 5 | Active |
| US10038446B2 | Reliability of physical unclonable function circuits | Electricity | 4 | Active |
| US9953726B1 | Fast quasi-parity checker for correlated electron switch (CES) memory array | Physics | 4 | Active |
| US11004479B2 | Method, system and device for integration of bitcells in a volatile memory array and bitcells in a non-volatile memory array | Physics | 3 | Active |
| US10825745B1 | Multi-die integrated circuits with improved testability | Electricity | 2 | Active |
| US9281027B1 | Test techniques in memory devices | Physics | 2 | Active |
| US10593397B1 | MRAM read and write methods using an incubation delay interval | Electricity | 2 | Active |
| US9721624B2 | Memory with multiple write ports | Physics | 2 | Active |
| US10267831B2 | Process variation compensation with correlated electron switch devices | Electricity | 1 | Active |
| US10783957B1 | Read and logic operation methods for voltage-divider bit-cell memory devices | Physics | 1 | Active |
| US10352971B2 | Voltage detection with correlated electron switch | Electricity | 1 | Active |
| US11295053B2 | Dielet design techniques | Physics | 1 | Active |
| US9997242B2 | Method, system and device for non-volatile memory device state detection | Physics | 1 | Active |
| US11211111B1 | CAM device with 3D CAM cells | Physics | 1 | Active |
| US9715965B2 | Electrical component with random electrical characteristic | Electricity | 1 | Active |
| US12080378B2 | Circuits and methods of detecting at least partial breakdown of canary circuits | Physics | 1 | Active |
| US10607659B2 | Method, system and device for integration of bitcells in a volatile memory array and bitcells in a non-volatile memory array | Physics | 1 | Active |
| US10991406B2 | Method, system and device for magnetic memory | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.