Patent · US Active

Polishing pad, polishing system and polishing method

US10040167B2 · kind B2 · utility

4Cited by
12References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 1, 2016
Grant dateAug 7, 2018
Priority date
Expiry dateNov 30, 2036

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/26
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad is provided. The polishing pad includes a polishing layer, which includes a central region, a peripheral region, and a main polishing region located between the central region and the peripheral region. At least one annular groove is located in the main polishing region of the polishing layer. A peripheral groove is located in the peripheral region, and the peripheral groove includes grid-shaped grooves. At least one radial extending groove is located in the main polishing region of the polishing layer, and the at least one radial extending groove is connected with the at least one annular groove. A polishing system including the polishing pad and a polishing method using the polishing pad are provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.