Buried interconnect for semiconductor circuits
US10043798B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2016 |
| Grant date | Aug 7, 2018 |
| Priority date | — |
| Expiry date | Aug 25, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D84/83
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor circuit comprises a Front End of Line (FEOL) comprising a plurality of transistors, each of which having a source region, a drain region and a gate region arranged between the source region and the drain region and comprising a gate electrode. The semiconductor circuit also comprises a buried interconnect that is arranged in the FEOL and electrically connected to the gate region from below through a bottom contact portion of the gate electrode. By using a buried interconnect the routing of the circuit may be facilitated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.