Patent · US Active

Buried interconnect for semiconductor circuits

US10043798B2 · kind B2 · utility

0Cited by
6References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 25, 2016
Grant dateAug 7, 2018
Priority date
Expiry dateAug 25, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/83
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor circuit comprises a Front End of Line (FEOL) comprising a plurality of transistors, each of which having a source region, a drain region and a gate region arranged between the source region and the drain region and comprising a gate electrode. The semiconductor circuit also comprises a buried interconnect that is arranged in the FEOL and electrically connected to the gate region from below through a bottom contact portion of the gate electrode. By using a buried interconnect the routing of the circuit may be facilitated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.