Method and apparatus for measuring a part
US10048065B2 · kind B2 · utility
2Cited by
9References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2013 |
| Grant date | Aug 14, 2018 |
| Priority date | — |
| Expiry date | Jan 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/047
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting an artifact on a machine tool includes: scanning a probe mounted on the machine tool along the surface of the artifact to be inspected. The method involves supplying a flow of fluid at least at the point of interaction between the probe and the artifact during the scanning.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.