Patent assignee · GB · COMPANY

RENISHAW PLC

561Patents
298Active
561Granted
56Portfolio score

Filing activity: Nov 9, 1983 → May 23, 2023 · 105 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US5189806A Method of and apparatus for scanning the surface of a workpiece Physics 219 Expired
US5040306A Surface-sensing device Physics 152 Expired
US5088046A Mounting for surface-sensing stylus and a method of using said mounting Physics 149 Expired
US5270664A Probe for measuring surface roughness by sensing fringe field capacitance effects Physics 143 Expired
US7341577B2 Implantable drug delivery pump Human Necessities 129 Expired
US5084981A Probe head Physics 117 Expired
US5442438A Spectroscopic apparatus and methods Physics 100 Expired
US5689333A Spectroscopic apparatus and methods Physics 96 Expired
US5541730A Interferometric measuring apparatus for making absolute measurements of distance or refractive index Physics 88 Expired
US7351239B2 Implantable drug delivery pump Human Necessities 79 Active
US5088337A Probe head Physics 75 Expired
US5194912A Raman analysis apparatus Physics 75 Expired
US7096077B2 Tool identification Emerging Cross-Sectional Technologies 71 Expired
US6909983B2 Calibration of an analogue probe Performing Operations; Transporting 70 Expired
US6633051B1 Surface sensing device with optical sensor Physics 65 Expired
US7676945B2 Modular measurement probe Physics 61 Active
US5623342A Raman microscope Physics 60 Expired
US4932131A Position determination apparatus Physics 58 Expired
US5125261A Analogue probe calibration Physics 55 Expired
US5006952A Capacitive transducers Physics 51 Expired
US5583443A Calibration of capacitance probe Physics 48 Expired
US8405387B2 Magnetic encoder scale and reference mark applicator and template Physics 47 Active
US5090131A Position determining apparatus Physics 45 Expired
US6470584B1 Locating arm for a probe on a coordinate positioning machine Physics 44 Expired
US5127735A System for measuring the position in space of an object using a light beam Physics 43 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.