Patent · US Active

Method and apparatus for automatic diagnosis of mis-compares

US10060976B1 · kind B1 · utility

2Cited by

2References

13Claims

0Family size

Assignee

Cadence Design Systems, Inc. · US

Inventors

Sharjinder Singh · Delhi, IN
Sameer Chakravarthy Chillarige · Bengaluru, IN
Robert Jordan Asher · Endicott, US
Sonam Kathpalia · Sidhauli, IN
Patrick Gallagher · Apalachin, US
Joseph Michael Swenton · Owego, US

Key dates

Filing date	May 10, 2016
Grant date	Aug 28, 2018
Priority date	—
Expiry date	May 19, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318371
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Systems and methods disclosed herein provide for automatically diagnosing mis-compares detected during simulation of Automatic Test Pattern Generation (“ATPG”) generated test patterns. Embodiments of the systems and methods provide for determining the origin of a mis-compare based on an analysis of the generated test patterns with a structural simulator and a behavioral simulator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.