Inventor · Owego, NY, US

Joseph Michael Swenton

18Patents
4h-index
19Co-inventors
57Inventor score

Filing activity: Dec 18, 2000 → Jul 14, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US7496816B2 Isolating the location of defects in scan chains Physics 11 Expired
US9400311B1 Method and system of collective failure diagnosis for multiple electronic circuits Physics 10 Active
US6708306B2 Method for diagnosing failures using invariant analysis Physics 8 Expired
US8190953B2 Method and system for selecting test vectors in statistical volume diagnosis using failed test data Physics 5 Active
US8813004B1 Analog fault visualization system and method for circuit designs Physics 4 Active
US7821276B2 Method and article of manufacture to generate IC test vector for synchronized physical probing Physics 3 Active
US11579194B1 Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects Physics 2 Active
US9864004B1 System and method for diagnosing failure locations in electronic circuits Physics 2 Active
US10338137B1 Highly accurate defect identification and prioritization of fault locations Physics 2 Active
US10060976B1 Method and apparatus for automatic diagnosis of mis-compares Physics 2 Active
US8402421B2 Method and system for subnet defect diagnostics through fault compositing Physics 2 Active
US11892501B1 Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns Physics 1 Active
US11740284B1 Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns Physics 1 Active
US8120378B2 System to control insertion of care-bits in an IC test vector improved optical probing Physics 1 Active
US11429776B1 Fault rules files for testing an IC chip Physics 1 Active
US11893336B1 Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip Physics 0 Active
US11435401B1 Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chip Physics 0 Active
US10180457B1 System and method performing scan chain diagnosis of an electronic design Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.