Product performance test binning

US10067184B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Theodoros E. Anemikos · Colchester, US
• Jeanne P. Bickford · South Burlington, US
• Nazmul Habib · South Burlington, US
• Susan K. Lichtensteiger · South Burlington, US

Key dates

• Filing date: Nov 11, 2011
• Grant date: Sep 4, 2018
• Expiry date: Dec 26, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31701
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method, test system and computer program product and system for voltage binning integrated circuit chips. The method includes selecting or changing a voltage bin of a set of voltages bins corresponding to frequency specification limits of an integrated circuit chip using functional testing of data paths of the integrated circuit chip.