System and method for device characterization
US10069663B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2017 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Jun 27, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L27/02
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A characterization system includes a signal detector. The signal detector includes a first conversion unit configured to receive, from a first device, a first device output signal including N possible discrete pulse amplitudes and generate a plurality of detected signals based on a plurality of threshold amplitudes respectively. The signal detector further includes a second conversion unit configured to generate a first conversion output signal and a second conversion output signal based on logic values included in the plurality of detected signals and provide first and second conversion output signals to an analysis unit for generating one or more measurements of the first device. The first and second conversion output signals include M1 and M2 possible discrete pulse amplitudes respectively. M1 and M2 are integers less than N.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.