Method for measuring the lifetime of an excited state in a sample
US10073034B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 14, 2012 |
| Grant date | Sep 11, 2018 |
| Priority date | — |
| Expiry date | Dec 26, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for measuring the lifetime of an excited state in a sample, in particular a fluorescence lifetime, and to an apparatus for carrying out such a method. First, an excitation pulse is generated and a sample region is illuminated with the excitation pulse. Then, a first digital data sequence is generated which is representative of the power-time profile of the excitation pulse, and a first switching instant is determined from the first digital data sequence. Moreover, the detection light emanating from the sample region is detected by a detector, and a second digital data sequence is generated which is representative of the power-time profile of the detection light, and a second switching instant is determined from the second digital data sequence. Finally, the time difference between the first and second switching instants is calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.