Bernd Widzgowski
37Patents
5h-index
21Co-inventors
69Inventor score
Filing activity: Dec 31, 1999 → Dec 12, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6423960B1 | Method and system for processing scan-data from a confocal microscope | Physics | 27 | Expired |
| US6444971B1 | Method and system for compensating intensity fluctuations of an illumination system in a confocal microscope | Physics | 21 | Expired |
| US8253937B2 | Optical evaluation method by means of laser pulses and corresponding apparatus | Physics | 10 | Active |
| US7190451B2 | Detection device | Physics | 6 | Expired |
| US6914238B2 | Method and apparatus for point-by-point scanning of a specimen | Physics | 6 | Expired |
| US6894271B2 | Method for operating a positioning apparatus, and scanning microscope | Physics | 5 | Expired |
| US8681412B2 | Acousto-optical system, microscope and method of use of the acousto-optical system | Physics | 4 | Active |
| US9042010B2 | Scanning microscope and method for optically scanning one or more samples | Physics | 3 | Active |
| US9036232B2 | Device for scanning an object, method for operating the device and scanning microscope | Physics | 3 | Active |
| US10520434B2 | Fluorescence lifetime imaging microscopy method having time-correlated single-photon counting, which method permits higher light intensities | Physics | 2 | Active |
| US10073034B2 | Method for measuring the lifetime of an excited state in a sample | Physics | 2 | Active |
| US8735790B2 | Method for examining an object using a microscope with delayed control signals and a microscope for examining an object | Physics | 2 | Active |
| US7492511B2 | Scanning microscope | Physics | 2 | Expired |
| US9772481B2 | Arrangement for use in the illumination of a specimen in SPIM microscopy | Physics | 2 | Active |
| US9450118B2 | Detector apparatus | Electricity | 1 | Active |
| US6859294B2 | Method for ascertaining position values, and scanning microscope | Physics | 1 | Expired |
| US7554722B2 | Scanning microscope with scanner frequency derived from pulsed laser | Physics | 1 | Active |
| US9476766B2 | Method and apparatus for examining a sample | Physics | 1 | Active |
| US8497463B2 | Device and method for counting photons | Electricity | 1 | Active |
| US7676071B2 | Method for illuminating a sample | Physics | 1 | Active |
| US11215853B2 | Electric circuit and method for driving an acousto-optic crystal | Electricity | 0 | Active |
| US11086119B2 | Fluorescence-lifetime imaging microscopy method having time-correlated single-photon counting | Physics | 0 | Active |
| US9411141B2 | Microscope and a method for examining a sample using a microscope | Physics | 0 | Active |
| US10627285B2 | Light/voltage converter circuit for converting intensity fluctuations of light into an alternating voltage measurement signal | Physics | 0 | Active |
| US11215503B2 | Method for counting photons by means of a photomultiplier | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.