Imaging apparatus and method
US10076261B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 2001 |
| Grant date | Sep 18, 2018 |
| Priority date | — |
| Expiry date | May 9, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/43
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.