TeraView Limited
43Patents
19Active
43Granted
57Portfolio score
Filing activity: Feb 23, 2000 → Feb 23, 2024 · 7 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8027709B2 | Radiation probe and detecting tooth decay | Physics | 102 | Active |
| US6957099B1 | Method and apparatus for terahertz imaging | Human Necessities | 62 | Expired |
| US6828558B1 | Three dimensional imaging | Physics | 50 | Expired |
| US7174037B2 | Imaging apparatus and method | Physics | 37 | Expired |
| US7693571B2 | Method and apparatus for terahertz imaging | Human Necessities | 26 | Active |
| US6865014B2 | Apparatus and method for investigating a sample | Physics | 25 | Expired |
| US7315175B2 | Probe apparatus and method for examining a sample | Physics | 23 | Expired |
| US7214940B2 | Apparatus and method for investigating a sample | Physics | 14 | Expired |
| US6958853B1 | Magnetically enhanced radiation source | Physics | 13 | Expired |
| US8138477B2 | THz investigation apparatus and method | Physics | 12 | Active |
| US7728296B2 | Spectroscopy apparatus and associated technique | Physics | 12 | Expired |
| US7244934B2 | Analysis apparatus and method | Physics | 12 | Expired |
| US7804069B2 | Imaging apparatus and method | Physics | 11 | Expired |
| US7335883B2 | Imaging apparatus and method | Physics | 11 | Expired |
| US7485863B2 | Method and apparatus for investigating a sample | Physics | 9 | Expired |
| US7663107B2 | Method and apparatus for quantitative analysis using terahertz radiation | Physics | 8 | Expired |
| US7152007B2 | Imaging apparatus and method | Physics | 8 | Expired |
| US7397428B2 | Coherent THz emitter with DC power reducing resistor | Physics | 5 | Expired |
| US7675036B2 | Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points | Physics | 4 | Expired |
| US10076261B2 | Imaging apparatus and method | Physics | 4 | Expired |
| US11085755B2 | Method and system for measuring coating thickness | Physics | 3 | Active |
| US8665423B2 | Method and apparatus for investigating a non-planar sample | Physics | 3 | Expired |
| US8399838B2 | Terahertz investigative system and method | Physics | 3 | Active |
| US7612341B2 | Image of sample using terahertz time domain spectroscopy in reflection mode to identify in a first material like normal breast tissue a second material like cancerous tissue by evaluating the phase change at the interface between the sample and a window like a quartz window, against which the sample is pressed | Physics | 3 | Expired |
| US7742172B2 | Apparatus for varying the path length of a beam of radiation | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.