Determining the resistance of a conducting structure
US10078721B2 · kind B2 · utility
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Key dates
| Filing date | Jun 3, 2016 |
| Grant date | Sep 18, 2018 |
| Priority date | — |
| Expiry date | Jun 3, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/23
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and techniques are described for determining a resistance of a conducting structure. The conducting structure can be partitioned into a set of polygons based on (1) equipotential lines and (2) boundaries of the conducting structure. Next, a matrix equation can be constructed, wherein for at least one polygon in the set of polygons, electric potentials of boundary elements on the boundaries of the polygon are represented by linear combinations of electric potentials of two or more equipotential lines. The resistance of the conducting structure can then be determined by solving the matrix equation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.