SYNOPSYS, INC.
🏢 View company profile →2,463Patents
2,058Active
2,463Granted
66Portfolio score
Filing activity: Oct 18, 1991 → Apr 29, 2024 · 577 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7247887B2 | Segmented channel MOS transistor | Electricity | 383 | Expired |
| US6009251A | Method and system for layout verification of an integrated circuit design with reusable subdesigns | Physics | 353 | Expired |
| US7190050B2 | Integrated circuit on corrugated substrate | Emerging Cross-Sectional Technologies | 310 | Expired |
| US5754826A | CAD and simulation system for targeting IC designs to multiple fabrication processes | Physics | 305 | Expired |
| US5684951A | Method and system for user authorization over a multi-user computer system | Physics | 275 | Expired |
| US7528465B2 | Integrated circuit on corrugated substrate | Emerging Cross-Sectional Technologies | 274 | Active |
| US7508031B2 | Enhanced segmented channel MOS transistor with narrowed base regions | Electricity | 269 | Active |
| US7265008B2 | Method of IC production using corrugated substrate | Electricity | 264 | Expired |
| US7605449B2 | Enhanced segmented channel MOS transistor with high-permittivity dielectric isolation material | Electricity | 259 | Active |
| US6405348B1 | Deep sub-micron static timing analysis in the presence of crosstalk | Physics | 235 | Expired |
| US8264065B2 | ESD/antenna diodes for through-silicon vias | Electricity | 231 | Active |
| US6378110B1 | Layer-based rule checking for an integrated circuit layout | Physics | 224 | Expired |
| US7028285B2 | Standard cell design incorporating phase information | Physics | 215 | Expired |
| US6931617B2 | Mask cost driven logic optimization and synthesis | Physics | 215 | Expired |
| US8312367B2 | Technique for dynamically sizing columns in a table | Physics | 213 | Active |
| US7132203B2 | Phase shift masking for complex patterns with proximity adjustments | Physics | 213 | Expired |
| US6968527B2 | High yield reticle with proximity effect halos | Electricity | 210 | Expired |
| US7509622B2 | Dummy filling technique for improved planarization of chip surface topography | Emerging Cross-Sectional Technologies | 208 | Active |
| US6918104B2 | Dissection of printed edges from a fabrication layout for correcting proximity effects | Emerging Cross-Sectional Technologies | 203 | Expired |
| US7454731B2 | Generation of engineering change order (ECO) constraints for use in selecting ECO repair techniques | Physics | 203 | Active |
| US6978436B2 | Design data format and hierarchy management for phase processing | Physics | 201 | Expired |
| US7458045B2 | Silicon tolerance specification using shapes as design intent markers | Physics | 199 | Expired |
| US7159197B2 | Shape-based geometry engine to perform smoothing and other layout beautification operations | Physics | 197 | Expired |
| US7421678B2 | Assist feature placement using a process-sensitivity model | Emerging Cross-Sectional Technologies | 195 | Active |
| US7509621B2 | Method and apparatus for placing assist features by identifying locations of constructive and destructive interference | Emerging Cross-Sectional Technologies | 193 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.