Patent · US Active

Built-in self-test for ADC

US10079610B2 · kind B2 · utility

3Cited by

4References

27Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Peter Bogner · Wernberg, AT
Andreas Kalt · Velden am Wörther See, AT
Jaafar Mejri · Ottobrunn, DE
Martin Pernull · Villach, AT

Key dates

Filing date	Jul 5, 2016
Grant date	Sep 18, 2018
Priority date	—
Expiry date	Jul 5, 2036

Classification

Technology area (CPC H)Electricity
CPC primaryH03M1/804
WIPO fieldBasic communication processes
WIPO sectorElectrical engineering

Abstract

Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.