Apparatus and method for classifying and locating electrical faults in circuitry
US10088518B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2017 |
| Grant date | Oct 2, 2018 |
| Priority date | — |
| Expiry date | Mar 31, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/079
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A die with a transmission circuit, a reception circuit, and a comparison circuit can be provided. The transmission circuit can be configured to transmit a first signal through a first channel at a first transmission rate and a first transmission amplitude. The reception circuit can be in communication with the transmission circuit through the first channel. The reception circuit can receive a second signal at a first reception rate and at a first reception amplitude. The comparison circuit can be in communication with the transmission circuit and the reception circuit. The comparison circuit can be configured to: determine a first rate error value, determine a first amplitude error value, compare the first rate error value with a rate threshold to determine a first rate error occurrence, and compare the first amplitude error value with an amplitude threshold to determine a first amplitude error occurrence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.