Spatially self-similar patterned illumination for depth imaging
US10088556B2 · kind B2 · utility
4Cited by
33References
14Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 23, 2016 |
| Grant date | Oct 2, 2018 |
| Priority date | — |
| Expiry date | Dec 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20056
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.