Cognex Corporation
622Patents
421Active
622Granted
59Portfolio score
Filing activity: Mar 19, 1986 → Jan 15, 2024 · 57 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5768443A | Method for coordinating multiple fields of view in multi-camera | Physics | 277 | Expired |
| US5481712A | Method and apparatus for interactively generating a computer program for machine vision analysis of an object | Physics | 239 | Expired |
| US6148120A | Warping of focal images to correct correspondence error | Physics | 211 | Expired |
| US6175644A | Machine vision system for object feature analysis and validation based on multiple object images | Emerging Cross-Sectional Technologies | 202 | Expired |
| US5640200A | Golden template comparison using efficient image registration | Physics | 178 | Expired |
| US6092059A | Automatic classifier for real time inspection and classification | Physics | 166 | Expired |
| US6728582B1 | System and method for determining the position of an object in three dimensions using a machine vision system with two cameras | Emerging Cross-Sectional Technologies | 128 | Expired |
| US6173070A | Machine vision method using search models to find features in three dimensional images | Physics | 123 | Expired |
| US5371690A | Method and apparatus for inspection of surface mounted devices | Physics | 123 | Expired |
| US6819779B1 | Lane detection system and apparatus | Physics | 120 | Expired |
| US6408109B1 | Apparatus and method for detecting and sub-pixel location of edges in a digital image | Physics | 118 | Expired |
| US5825913A | System for finding the orientation of a wafer | Electricity | 116 | Expired |
| US5495537A | Methods and apparatus for machine vision template matching of images predominantly having generally diagonal and elongate features | Physics | 116 | Expired |
| US5796868A | Object edge point filtering system for machine vision | Physics | 108 | Expired |
| US6297844A | Video safety curtain | Electricity | 106 | Expired |
| US5640199A | Automated optical inspection apparatus | Electricity | 105 | Expired |
| US4972359A | Digital image processing system | Physics | 102 | Expired |
| US5548326A | Efficient image registration | Physics | 102 | Expired |
| US6259827A | Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images | Physics | 102 | Expired |
| US6137893A | Machine vision calibration targets and methods of determining their location and orientation in an image | Physics | 101 | Expired |
| US8576390B1 | System and method for determining and controlling focal distance in a vision system camera | Electricity | 100 | Active |
| US5850466A | Golden template comparison for rotated and/or scaled images | Physics | 100 | Expired |
| US5974169A | Machine vision methods for determining characteristics of an object using boundary points and bounding regions | Physics | 96 | Expired |
| US5960125A | Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object | Physics | 95 | Expired |
| US6005978A | Robust search for image features across image sequences exhibiting non-uniform changes in brightness | Physics | 91 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.