Patent · US Active

Polishing composition and polishing method

US10093834B2 · kind B2 · utility

0Cited by
1References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 28, 2015
Grant dateOct 9, 2018
Priority date
Expiry dateAug 28, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3212
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

There are provided a polishing composition and a method for polishing capable of, when a substrate including polysilicon is polished, limiting the polishing rate of the polysilicon, and selectively polishing a silicon compound other than the polysilicon, such as silicon nitride. The polishing composition used includes abrasives, an organic acid and a conjugate base of the organic acid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.