Patent · US Active

Optical layer system

US10094961B2 · kind B2 · utility

5Cited by

7References

20Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Peter Speckbacher · Kirchweidach, DE
Stefan Funk · Leichlingen, DE
Christian Baeuml · Traunwalchen, DE

Key dates

Filing date	Sep 29, 2016
Grant date	Oct 9, 2018
Priority date	—
Expiry date	Nov 3, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/38
WIPO fieldOptics
WIPO sectorInstruments

Abstract

An optical layer system for a position-measuring device includes at least first, second and third functional surfaces disposed on a surface of a transparent substrate. Each of the functional surfaces have a different optical function. The functional surfaces are composed of a first layer stack and a second layer stack.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.