Electromagnetic verification of integrated circuits
US10107855B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2014 |
| Grant date | Oct 23, 2018 |
| Priority date | — |
| Expiry date | Jan 20, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatuses, systems, and methods for detecting changes to an IC are disclosed. In an example implementation, an apparatus includes an electromagnetic (EM) sensor. A high-resolution analog-to-digital converter (ADC) is configured to quantize a segment of the EM signal of an IC measured by the EM sensor. The quantized segment of the EM signal is unique to process-voltage-temperature (PVT) characteristics exhibited by the IC. The apparatus also includes a processing circuit configured to prompt the high-resolution ADC, via a control signal, to produce the quantized segment of the EM signal. The processing circuit determines a first signature from the quantized segment and retrieves a baseline signature corresponding to the IC from a data storage circuit. In response to the first signature being different from the baseline signature, the processing circuit indicates that a change to the IC is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.