Patent · US Active

System and method for binning at final test

US10118200B2 · kind B2 · utility

1Cited by

9References

28Claims

0Family size

Assignee

OPTIMAL PLUS LTD. · IL

Inventors

Reed Linde · Cameron Park, US
Gil Balog · Jerusalem, IL

Key dates

Filing date	Jul 6, 2009
Grant date	Nov 6, 2018
Priority date	—
Expiry date	Jul 19, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2894
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Systems and methods for sorting an electronic device undergoing a final test operation in accordance with a test program, into one of a plurality of bins. In one embodiment, an evaluator defines the binning of the electronic device while the device is still socketed, and the defined binning may or may not concur with the binning assigned by the test program.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.