OPTIMAL PLUS LTD.
23Patents
23Active
23Granted
51Portfolio score
Filing activity: Jul 6, 2009 → Nov 16, 2023
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9767459B1 | Detection of counterfeit electronic items | Physics | 5 | Active |
| US9529036B2 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Physics | 2 | Active |
| US11402419B2 | Method and system for real time outlier detection and product re-binning | Physics | 2 | Active |
| US11068478B2 | Augmenting reliability models for manufactured products | Emerging Cross-Sectional Technologies | 2 | Active |
| US11061795B2 | Methods of smart pairing | Physics | 2 | Active |
| US9885751B2 | Dynamic process for adaptive tests | Physics | 2 | Active |
| US8838408B2 | Misalignment indication decision system and method | Physics | 2 | Active |
| US11143689B2 | Method and system for data collection and analysis for semiconductor manufacturing | Emerging Cross-Sectional Technologies | 1 | Active |
| US8781773B2 | System and methods for parametric testing | Electricity | 1 | Active |
| US11475187B2 | Augmented reliability models for design and manufacturing | Physics | 1 | Active |
| US10118200B2 | System and method for binning at final test | Physics | 1 | Active |
| US11919046B2 | System and method for binning at final test | Physics | 0 | Active |
| US11829125B2 | Augmenting reliability models for manufactured products | Emerging Cross-Sectional Technologies | 0 | Active |
| US12079554B2 | Augmented reliability models for design and manufacturing | Physics | 0 | Active |
| US10794955B2 | Methods and systems for testing a tester | Physics | 0 | Active |
| US12339305B2 | Method and system for real time outlier detection and product re-binning | Physics | 0 | Active |
| US11907095B2 | Methods of smart pairing | Physics | 0 | Active |
| US11235355B2 | System and method for binning at final test | Physics | 0 | Active |
| US8872538B2 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Physics | 0 | Active |
| US11852684B2 | Methods and systems for detecting defects on an electronic assembly | Electricity | 0 | Active |
| US11650250B2 | Methods and systems for detecting defects on an electronic assembly | Electricity | 0 | Active |
| US11852668B2 | Method and system for real time outlier detection and product re-binning | Physics | 0 | Active |
| US11775876B2 | Methods and systems for relating features with labels in electronics | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.