Probe card
US10119995B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 8, 2014 |
| Grant date | Nov 6, 2018 |
| Priority date | — |
| Expiry date | Feb 14, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07378
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe card including a circuit board, a transformer, a probe head, and a reinforcement structure is provided. The transformer including a body, a plurality of solder balls, and a plurality of first contact points are disposed on the substrate. The body has a first surface and a second surface, wherein the first surface is located between the circuit board and the second surface. The solder balls are disposed on the first surface, and the first contact points are disposed on the second surface. The probe head is disposed on the second surface. The probe head is electrically connected to the circuit board by the first solder balls. The reinforcement structure is disposed between the probe head and the circuit board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.