Patent · US Active

Gate line plug structures for advanced integrated circuit structure fabrication

US10121882B1 · kind B1 · utility

27Cited by
28References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 2017
Grant dateNov 6, 2018
Priority date
Expiry dateDec 30, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/0149
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the disclosure are in the field of advanced integrated circuit structure fabrication and, in particular, 10 nanometer node and smaller integrated circuit structure fabrication and the resulting structures. In an example, an integrated circuit structure includes a first silicon fin having a longest dimension along a first direction. A second silicon fin having a longest dimension is along the first direction. An insulator material is between the first silicon fin and the second silicon fin. A gate line is over the first silicon fin and over the second silicon fin along a second direction, the second direction orthogonal to the first direction, the gate line having a first side and a second side, wherein the gate line has a discontinuity over the insulator material, the discontinuity filled by a dielectric plug.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.