Method and apparatus for measuring a part
US10132622B2 · kind B2 · utility
4Cited by
11References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 3, 2014 |
| Grant date | Nov 20, 2018 |
| Priority date | — |
| Expiry date | Jul 5, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37043
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring a part with a contact probe mounted on a coordinate positioning machine. The method includes measuring a plurality of points on the part when both the part and contact probe are moving continuously between different positions within the coordinate positioning machine. The probe moves, relative to the part, along a scan path such that substantially coincident points that are closely located together along a curve or surface being measured are measured at relatively far apart positions in the machine and at relatively far apart positions along the scan path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.